October 1, 2015 at 1:10 pm #email@example.comParticipant
We are working on a project where we want to see how the SCIO technique compares with professional spectroscopy techniques like FTIR. We would like to know what you think will be the best way to compare these two techniques?
The reason we ask is because, we find it difficult to put these two techniques against each other. The results from the SCIO scan seem to be projected in a different way as the FTIR results. We know what is presented in the FTIR graphs, but we can’t figure out what is precisely presented in the graphs from the SCIO scans. So what is precisely presented in the graphs from the SCIO scans? which units are used on the x and y axes and at what magnitude.
TU DelftOctober 1, 2015 at 1:45 pm #2176AdminKeymaster
Thanks so much for contacting us.
I will contact you shortly with the information you have requested.
AssafOctober 8, 2015 at 12:16 pm #firstname.lastname@example.orgParticipant
Can we still expect an answer from you guys?November 12, 2015 at 10:29 am #2367AyeletKeymasterNovember 13, 2015 at 10:30 am #2373LaurentSpectator
Can the answer be shared? I am also interested in this.
Thank youNovember 15, 2015 at 4:34 pm #email@example.comParticipant
Please do share this information as it will be helpful in answering questions from the scientific community in regards to viability and trustworthiness of the SCiO methodology.
Additionally, what legal disclaimers will be required with any application that is developed?November 23, 2015 at 3:07 pm #2412AyeletKeymasterHi all,Regarding the displayed graphs from SCiO scans:
(only): Assumes Beer-Lambert model is valid, and transforms the measured signal to be linear with concentration by doing a log transform and adjusting the result for noise and deviations from the model.
(only): Performs normalization of the signal. This is meant to compensate for changing measurement conditions (e.g. varied scanning distances) that typically occur from sample to sample. Y axis still means reflectance but in normalized units instead of raw reflectance.
Both and : First assumes Beet-Lambert model (Processed) and then normalizes the results to compensate for differences in the optical path between samples. This is useful, for example, when there is variation in the thickness of the samples.
Both and :Similar to Processed and Normalized, uses a more aggressive form of Processed. Adds more noise, but in some cases may be the only way to create a good model.January 8, 2016 at 7:57 pm #firstname.lastname@example.orgParticipant
Hi, I am also trying to convert SCiO spectra to be comparable to a standard FTIR reference library. Have you had any luck? I am trying to open the raw SCiO data in Spekwin32, and output as .dx. Has anyone tried this or any other method?
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